• DocumentCode
    1759178
  • Title

    Variation and Reliability in FPGAs

  • Author

    Stott, Edward ; Guan, Zhenyu ; Levine, Joshua M. ; Wong, Justin S. J. ; Cheung, Peter Y. K.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Imperial Coll. London, London, UK
  • Volume
    30
  • Issue
    6
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    50
  • Lastpage
    59
  • Abstract
    This paper focuses on variability and reliability issues for FPGAs. The paper shows how these issues can be effectively addressed using one of the most powerful features of FPGAs: their ability and flexibility to be reconfigured. The paper also presents techniques for characterizing variability and degradation in these systems.
  • Keywords
    field programmable gate arrays; integrated circuit reliability; FPGA; reliability issue; system degradation; variability issue; Aging; Degradation; Delays; Equipment; Field programmable gate arrays; Integrated circuit modeling; Registers;
  • fLanguage
    English
  • Journal_Title
    Design & Test, IEEE
  • Publisher
    ieee
  • ISSN
    2168-2356
  • Type

    jour

  • DOI
    10.1109/MDAT.2013.2266652
  • Filename
    6527307
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1759178