Title :
Variation and Reliability in FPGAs
Author :
Stott, Edward ; Guan, Zhenyu ; Levine, Joshua M. ; Wong, Justin S. J. ; Cheung, Peter Y. K.
Author_Institution :
Dept. of Electr. & Electron. Eng., Imperial Coll. London, London, UK
Abstract :
This paper focuses on variability and reliability issues for FPGAs. The paper shows how these issues can be effectively addressed using one of the most powerful features of FPGAs: their ability and flexibility to be reconfigured. The paper also presents techniques for characterizing variability and degradation in these systems.
Keywords :
field programmable gate arrays; integrated circuit reliability; FPGA; reliability issue; system degradation; variability issue; Aging; Degradation; Delays; Equipment; Field programmable gate arrays; Integrated circuit modeling; Registers;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2013.2266652
