A Novel Fault Diagnostic Method Based on Node-Voltage Vector Ambiguity Sets

A novel fault diagnostic method based on node-voltage vector ambiguity sets for analog circuits is presented in this paper. The method uses a sinusoidal stimulus instead of a dc-based stimulus. It employs steady-state node-voltage responses on observable nodes under different fault conditions to establish node-voltage vector ambiguity sets for fault diagnosis. An ellipse-based measurement solution to measure node-voltage vectors is also described. A frequency selection algorithm for a sinusoidal stimulus is introduced. A fault diagnostic example based on the node-voltage vector ambiguity sets is presented. Finally, a programming strategy to extend the method to large-scale analogue circuit designs is described.