DocumentCode :
1759495
Title :
Novel Bipolar-Enhanced Tunneling FET With Simulated High On-Current
Author :
Wan, J. ; Zaslavsky, A. ; Le Royer, C. ; Cristoloveanu, S.
Author_Institution :
IMEP-LAHC, INP-Grenoble, Grenoble, France
Volume :
34
Issue :
1
fYear :
2013
fDate :
Jan. 2013
Firstpage :
24
Lastpage :
26
Abstract :
We propose and simulate a new device combining a tunneling field-effect transistor (TFET) with a heterojunction bipolar transistor (HBT). The carriers generated in the tunneling junction are used as base current to drive the HBT and obtain a high bipolar current. Owing to the sharp switching of the TFET and high HBT current gain, the CMOS-compatible Si/Si1-xGex device shows a subthreshold swing of <; 60 mV/ dec over seven decades of current, a high ON current, and scaling capability down to 10 nm.
Keywords :
field effect transistors; heterojunction bipolar transistors; HBT; bipolar-enhanced tunneling FET; field-effect transistor; heterojunction bipolar transistor; tunneling junction; Charge carrier processes; Heterojunction bipolar transistors; Junctions; Logic gates; Silicon; Tunneling; Bipolar-enhanced tunneling field-effect transistor (TFET) (BET-FET); FET; heterojunction bipolar transistor (HBT); sharp switch; tunneling;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2012.2228159
Filename :
6384662
Link To Document :
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