DocumentCode
1759669
Title
Exploiting Model Morphology for Event-Based Testing
Author
Belli, Fevzi ; Beyazit, Mutlu
Author_Institution
Dept. of Electr. Eng. & Inf. Technol., Univ. of Paderborn, Paderborn, Germany
Volume
41
Issue
2
fYear
2015
fDate
Feb. 1 2015
Firstpage
113
Lastpage
134
Abstract
Model-based testing employs models for testing. Model-based mutation testing (MBMT) additionally involves fault models, called mutants, by applying mutation operators to the original model. A problem encountered with MBMT is the elimination of equivalent mutants and multiple mutants modeling the same faults. Another problem is the need to compare a mutant to the original model for test generation. This paper proposes an event-based approach to MBMT that is not fixed on single events and a single model but rather operates on sequences of events of length k ≥ 1 and invokes a sequence of models that are derived from the original one by varying its morphology based on k. The approach employs formal grammars, related mutation operators, and algorithms to generate test cases, enabling the following: (1) the exclusion of equivalent mutants and multiple mutants; (2) the generation of a test case in linear time to kill a selected mutant without comparing it to the original model; (3) the analysis of morphologically different models enabling the systematic generation of mutants, thereby extending the set of fault models studied in related literature. Three case studies validate the approach and analyze its characteristics in comparison to random testing and another MBMT approach.
Keywords
computational complexity; grammars; program testing; MBMT; equivalent mutant; event-based approach; event-based testing; fault models; formal grammars; linear time; model morphology; model-based mutation testing; multiple mutants; mutants; mutation operators; random testing; test generation; Analytical models; Context; Grammar; Morphology; Production; Testing; Unified modeling language; (model) morphology; Model-based mutation testing; grammar-based testing; mutant selection; test generation;
fLanguage
English
Journal_Title
Software Engineering, IEEE Transactions on
Publisher
ieee
ISSN
0098-5589
Type
jour
DOI
10.1109/TSE.2014.2360690
Filename
6915728
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