DocumentCode :
1759728
Title :
Error Control Schemes for Modern Flash Memories: Solutions for Flash deficiencies
Author :
Sala, Frederic ; Schouhamer Immink, Kees A. ; Dolecek, Lara
Author_Institution :
Electr. Eng. Dept., UCLA, Los Angeles, CA, USA
Volume :
4
Issue :
1
fYear :
2015
fDate :
Jan. 2015
Firstpage :
66
Lastpage :
73
Abstract :
Flash, already one of the dominant forms of data storage for mobile consumer devices, such as smartphones and media players, is experiencing explosive growth in cloud and enterprise applications. Flash devices offer very high access speeds, low power consumption, and physical resiliency. Our goal in this article is to provide a high-level overview of error correction for Flash. We will begin by discussing Flash functionality and design. We will introduce the nature of Flash deficiencies. Afterwards, we describe the basics of ECCs. We discuss BCH and LDPC codes in particular and wrap up the article with more directions for Flash coding.
Keywords :
BCH codes; error correction codes; flash memories; parity check codes; BCH code; LDPC code; error control; error correction code; flash coding; flash deficiencies solution; flash deficiencies solutions; flash memories; modern flash memories; Data storage; Error statistics; Flash memory; Low power electronics; Mobile communication; Mobile handsets; Power consumption; Smart phones;
fLanguage :
English
Journal_Title :
Consumer Electronics Magazine, IEEE
Publisher :
ieee
ISSN :
2162-2248
Type :
jour
DOI :
10.1109/MCE.2014.2360965
Filename :
6985951
Link To Document :
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