DocumentCode :
1759738
Title :
Soft X-Ray Single-Photon Detection With Superconducting Tantalum Nitride and Niobium Nanowires
Author :
Inderbitzin, K. ; Engel, Andreas ; Schilling, Andreas
Author_Institution :
Phys. Inst., Univ. of Zurich, Zurich, Switzerland
Volume :
23
Issue :
3
fYear :
2013
fDate :
41426
Firstpage :
2200505
Lastpage :
2200505
Abstract :
We have fabricated ultrafast dark count-free soft X-ray single-photon detectors (X-SNSPDs) from TaN with various conduction path widths, and we compare their properties with corresponding data from a Nb X-SNSPD. The TaN X-SNSPDs offer an improved detector performance regarding device detection efficiency, latching, and pulse amplitudes. Wide conduction paths allow for a certain energy-resolving capability in contrast to narrow TaN conduction paths. However, wide paths also limit the detection efficiency at low temperatures, which can be explained within a hot-spot model.
Keywords :
nanowires; superconducting devices; X-SNSPD; device detection efficiency; latching; niobium nanowires; pulse amplitudes; superconducting tantalum nitride; ultrafast dark count-free soft X-ray single-photon detectors; Detectors; Films; Nanowires; Niobium; Photonics; Temperature; Temperature measurement; Nanofabrication; soft X-ray detectors; superconducting nanowire single-photon detectors; superconductors; tantalum nitride;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2012.2234496
Filename :
6384686
Link To Document :
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