• DocumentCode
    1759756
  • Title

    Modeling and Application of Multi-Port TSV Networks in 3-D IC

  • Author

    Wei Yao ; Siming Pan ; Achkir, Brice ; Jun Fan ; Lei He

  • Author_Institution
    Cisco Syst., San Jose, CA, USA
  • Volume
    32
  • Issue
    4
  • fYear
    2013
  • fDate
    41365
  • Firstpage
    487
  • Lastpage
    496
  • Abstract
    Through-silicon-via (TSV) enables vertical connectivity between stacked chips or interposer and is a key technology for 3-D integrated circuits (ICs). While arrays of TSVs are needed in 3-D IC, there only exists a frequency-dependent resistance, inductance, conductance and capacitance circuit model for a pair of TSVs with coupling between them. In this paper, we develop a simple yet accurate circuit model for a multiport TSV network (e.g., coupled TSV array) by decomposing the network into a number of TSV pairs and then applying circuit models for each of them. We call the new model a pair-based model for the multiport TSV network. It is first verified against a commercial electromagnetic solver for up to 20 GHz and subsequently employed for a variety of examples for signal and power integrity analysis.
  • Keywords
    three-dimensional integrated circuits; 3D IC; 3D integrated circuits; capacitance circuit model; conductance; coupled TSV array; electromagnetic solver; frequency dependent resistance; inductance; interposer; multiport TSV networks; power integrity analysis; stacked chips; through silicon via; Capacitance; Impedance; Inductance; Integrated circuit modeling; Silicon; Solid modeling; Through-silicon vias; 3-D integration; conductance and capacitance (RLGC) matrices; crosstalk; inductance; modeling; packaging; power delivery; resistance; through-silicon via (TSV);
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2012.2228740
  • Filename
    6480846