DocumentCode :
17600
Title :
Three Round Adaptive Diagnosis in Hierarchical Multiprocessor Systems
Author :
Pao-Lien Lai ; Ming-Yi Chiu ; Chang-Hsiung Tsai
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Dong Hwa Univ., Hualien, Taiwan
Volume :
62
Issue :
3
fYear :
2013
fDate :
Sept. 2013
Firstpage :
608
Lastpage :
617
Abstract :
System level diagnosis is an important technique for fault detection and location in multiprocessor computing systems. Adaptive diagnosis, proposed by Nakajima, is a practical system level diagnostic scheme; the main design objective of an adaptive diagnostic scheme is to reduce the number of test rounds, as well as the total number of tests. The hierarchical crossed cube draws upon constructions used within both the hypercube and the crossed cube, giving it many desirable features such as symmetry and logarithmic diameter, making it suitable for massively parallel systems with thousands of processors. In this paper, we first show that the diagnosability of a hierarchical crossed cube, HCCk,n, is k+n, and then propose a scheme that completely diagnoses a HCCk,n within three test rounds, and at most N+⌈(k+n+2)/2⌉ × ⌊(k+n+2)/2⌋ tests, where N=2k+2n is the number of vertices of HCCk,n. Our diagnostic scheme has the optimal number of test rounds. Moreover, most of our proofs are applicable not just to hierarchical crossed cubes but also to hierarchical interconnection networks formed by replacing crossed cubes with other appropriate interconnection networks.
Keywords :
multiprocessing systems; parallel processing; HCCk,n; hierarchical crossed cube; hierarchical interconnection networks; hierarchical multiprocessor computing systems; hypercube; parallel systems; practical system level diagnostic scheme; system level diagnosis; three round adaptive diagnosis; Adaptive systems; Fault diagnosis; Hypercubes; Multiprocessing systems; Program processors; Visualization; Adaptive diagnosis; Hamiltonian; cycle decomposition; diagnosability; hierarchical crossed cube; interconnection networks; reflected edge label sequence;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2013.2270411
Filename :
6550035
Link To Document :
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