DocumentCode :
1760132
Title :
A Time-of-Flight Range Image Sensor With Background Canceling Lock-in Pixels Based on Lateral Electric Field Charge Modulation
Author :
Sang-Man Han ; Takasawa, Taishi ; Yasutomi, Keita ; Aoyama, Satoshi ; Kagawa, Keiichiro ; Kawahito, Shoji
Author_Institution :
Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
Volume :
3
Issue :
3
fYear :
2015
fDate :
42125
Firstpage :
267
Lastpage :
275
Abstract :
This paper presents a CMOS time-of-flight (ToF) range image sensor using high-speed lock-in pixels with background light canceling capability. The proposed lock-in pixel uses MOS gate-induced lateral electric field control of depleted potential of pinned photodiode for implementing a multiple-tap charge modulator while achieving a high-speed charge transfer for high-time resolution. A TOF image sensor with 320 x 240 effective pixels is implemented using a 0.11-μm CMOS image sensor process. The TOF sensor has a range resolution of less than 12 mm without background light and 20 mm under background line for the range from 0.8 to 1.8 m and integration time of 50 ms. The effectiveness of in-pixel background light canceling with a three-tap output pixel is demonstrated.
Keywords :
CMOS image sensors; MIS devices; charge exchange; interference suppression; p-i-n photodiodes; time of flight spectra; CMOS image sensor process; CMOS time-of-flight range image sensor; MOS gate induced lateral electric field control; background canceling lock-in pixel; charge transfer; lateral electric field charge modulation; multiple tap charge modulator; pinned photodiode; range resolution; size 0.11 mum; time 50 ms; Capacitors; Electric fields; Electric potential; Image sensors; Logic gates; Modulation; Sensitivity; CMOS image sensor; Time-of-Flight (ToF); depth image; depth image,; lateral electric field charge modu-lator (LEFM); lateral electric field charge modulator (LEFM); pinned pho-todiode; pinned photodiode; time-of-flight (ToF);
fLanguage :
English
Journal_Title :
Electron Devices Society, IEEE Journal of the
Publisher :
ieee
ISSN :
2168-6734
Type :
jour
DOI :
10.1109/JEDS.2014.2382689
Filename :
6987251
Link To Document :
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