• DocumentCode
    1760413
  • Title

    Symmetrical Large-Signal Modeling of Microwave Switch FETs

  • Author

    Prasad, Athul ; Fager, Christian ; Thorsell, Mattias ; Andersson, Christer M. ; Yhland, K.

  • Author_Institution
    Dept. of Microtechnol. & Nanosci., Chalmers Univ. of Technol., Goteborg, Sweden
  • Volume
    62
  • Issue
    8
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    1590
  • Lastpage
    1598
  • Abstract
    This paper presents a new symmetrical field-effect transistor (FET) model suitable for microwave switches. The model takes advantage of the inherent symmetry of typical switch devices, justifying a new small-signal model where all intrinsic model parameters can be mirrored between the positive and negative drain-source bias regions. This small-signal model is utilized in a new and simplified approach to large-signal modeling of these type of devices. It is shown that the proposed large-signal model only needs a single charge expression to model all intrinsic capacitances. For validation of the proposed model, small-signal measurements from 100 MHz to 50 GHz and large-signal measurements at 600 MHz and 16 GHz, are carried out on a GaAs pHEMT. Good agreement between the model and the measurements is observed under both small- and large-signal conditions with particularly accurate prediction of higher harmonic content. The reduced measurement requirements and complexity of the symmetrical model demonstrates its advantages. Further, supporting operation in the negative drain-source voltage region, the model is robust and applicable to a variety of circuits, e.g., switches, resistive mixers, oscillators, etc.
  • Keywords
    III-V semiconductors; field effect transistor switches; gallium arsenide; high electron mobility transistors; microwave field effect transistors; microwave switches; semiconductor device models; GaAs; field-effect transistor; frequency 100 MHz to 50 GHz; intrinsic capacitance model; intrinsic model parameter; microwave switch FET; negative drain-source bias region; negative drain-source voltage region; oscillator; pHEMT; positive drain-source bias region; resistive mixer; single charge expression; small-signal measurement; small-signal model; symmetrical large-signal modeling; Gallium arsenide; Integrated circuit modeling; Mathematical model; PHEMTs; Switches; Switching circuits; Field-effect transistors (FETs); GaAs; HEMTs; large-signal model; microwave switch; modeling; semiconductor device modeling; small-signal model; symmetrical model;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2014.2332303
  • Filename
    6856237