DocumentCode
1760553
Title
The LEXNET Project: Wireless Networks and EMF: Paving the Way for Low-EMF Networks of the Future
Author
Tesanovic, Milos ; Conil, E. ; De Domenico, Antonio ; Aguero, Ramon ; Freudenstein, Frederik ; Correia, Luis M. ; Bories, S. ; Martens, Luc ; Wiedemann, Peter M. ; Wiart, Joe
Author_Institution
Fujitsu Labs. of Eur. Ltd., Hayes, UK
Volume
9
Issue
2
fYear
2014
fDate
41791
Firstpage
20
Lastpage
28
Abstract
While, according to the World Health Organization, no adverse health effects of radio-frequency (RF) electromagnetic fields (EMFs) have been established to date, EMF exposure from wireless communication networks is nonetheless often cited as a major cause of public concern and is frequently given considerable media coverage. This article presents the results of a new survey on RF-EMF exposure risk perception together with a comprehensive overview of the EMF footprint of existing and emerging networks. On the basis of these findings, we then put forward the rationale for EMF-aware networking. Subsequently, we highlight the gaps in existing systems, which impede EMF-aware networking, and outline the key concepts of the recently launched European Union (EU) Seventh Framework Programme (FP7) Integrated Project Low-EMF Exposure Future Networks (LEXNET): a new, all-encompassing, population-based metric of exposure and ways it can be used for low-EMF, quality of service (QoS)-aware network optimization.
Keywords
biological effects of fields; quality of service; radio networks; EMF-aware networking; EU FP7 Integrated Project Low-EMF Exposure Future Networks; European Union; LEXNET project; QoS-aware network optimization; RF-EMF exposure risk perception; Seventh Framework Programme; World Health Organization; quality of service; radio-frequency electromagnetic fields; wireless communication networks; Base stations; Electromagnetic fields; Measurement; Mobile handsets; Radio frequency; Safety; Sociology; Wireless communication; Wireless networks;
fLanguage
English
Journal_Title
Vehicular Technology Magazine, IEEE
Publisher
ieee
ISSN
1556-6072
Type
jour
DOI
10.1109/MVT.2014.2312272
Filename
6807642
Link To Document