DocumentCode :
1760865
Title :
Electromechanical Modeling of \\hbox {Nb}_{3}\\hbox {Sn} Superconducting Wires Subjected to Periodic Bending Strain
Author :
Breschi, Marco ; Ribani, Pier Luigi ; Scurti, Federico ; Nijhuis, Arend ; Bajas, Hugo ; Devred, Arnaud
Author_Institution :
Dept. of Electr., Electron. & Inf. Eng., Univ. of Bologna, Bologna, Italy
Volume :
25
Issue :
3
fYear :
2015
fDate :
42156
Firstpage :
1
Lastpage :
5
Abstract :
The transport performance of Nb3Sn cable-inconduit conductors (CICCs) depends on the strain distribution along the superconducting filaments determined by the combination of electromagnetic and mechanical forces applied to the strands. Experimental studies on the effect of bending strain were performed at the University of Twente by means of the Test Arrangement for Strain Influence on Strands (TARSIS) facility. The aim of this paper is to verify the agreement between a detailed electromechanical model of the wire and the experimental results obtained in TARSIS. A numerical model of two Nb3Sn internal tin strands was developed, which describes the wire through a distributed parameter nonlinear electrical circuit. The model requires a single strand to be discretized into a number of elements, connected by transverse conductances and subjected to a given strain distribution. The strain distribution maps were computed at the École Centrale Paris by means of the MULTIFIL code at different experimental conditions in the TARSIS facility. The simulation results show good agreement with the experimental ones in terms of both critical current and n-value degradation.
Keywords :
bending; critical currents; electromagnetic forces; electromechanical effects; multifilamentary superconductors; niobium alloys; numerical analysis; superconducting cables; tin alloys; MULTIFIL code; Nb3Sn; TARSIS facility; bending strain effect; cable-inconduit conductors; critical current; distributed parameter nonlinear electrical circuit; electromagnetic force; electromechanical modeling; internal tin strands; mechanical force; n-value degradation; numerical model; periodic bending strain; strain distribution maps; superconducting filaments; superconducting wires; transport performance; transverse conductances; Conductors; Critical current density (superconductivity); Educational institutions; Niobium-tin; Numerical models; Strain; Wires; $hbox{Nb}_{3}hbox{Sn}$ wires; Bending strain; Degradation; Electromechanical modeling; Nb3Sn wires; degradation; electromechanical modeling;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2014.2361520
Filename :
6915883
Link To Document :
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