Title :
300-
GHz Operation of Divider Circuits Using High-
Josephson Junctions
Author :
Olaya, David ; Dresselhaus, Paul D. ; Benz, Samuel P.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We investigated high-current-density Josephson junctions with NbxSi1-x barriers in single-flux-quantum (SFQ) digital circuits to evaluate their performance at clock frequencies of hundreds of gigahertz. We fabricated static divider SFQ circuits with a-NbxSi1-x and a-Si barriers for Jc ranging from 3.5 to 85 kA/cm2. For junctions in the lower Jc range (3.5-17 kA/cm2), we used optical lithography, and for the 85-kA/cm2 junctions, we used electron-beam lithography. We measured SFQ circuits with a maximum operating speed of 300 GHz by use of intrinsically shunted junctions having submicrometer dimensions and an 85-kA/cm2 critical current density. These results demonstrate that silicide-barrier junctions have the potential to achieve high-speed SFQ circuits and high-density circuits because the junctions are small and do not require external shunt resistors.
Keywords :
critical current density (superconductivity); dividing circuits; electron beam lithography; niobium; niobium compounds; photolithography; superconducting logic circuits; type II superconductors; Nb-NbxSi1-x-Nb; clock frequency; critical current density; electron-beam lithography; frequency 300 GHz; high-Jc Josephson junctions; high-current-density Josephson junctions; high-density circuits; high-speed SFQ circuits; intrinsically shunted junctions; optical lithography; silicide-barrier junctions; single-flux-quantum digital circuits; static divider SFQ circuits; submicrometer dimensions; Critical current density (superconductivity); Fabrication; Frequency conversion; Frequency measurement; Josephson junctions; Junctions; Niobium; Josephson devices; Josephson junctions; Josephson logic; Niobium; Superconducting device fabrication; Superconducting devices; niobium; superconducting device fabrication; superconducting devices;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2014.2373317