Title :
Sensitivity Analysis of TRL Calibration in Waveguide Integrated Membrane Circuits
Author :
Stenarson, J. ; Thanh Ngoc Thi Do ; Huan Zhao ; Sobis, Peter J. ; Aik-Yean Tang ; Yhland, K. ; Stake, Jan
Author_Institution :
SP Tech. Res. Inst. of Sweden, Borås, Sweden
Abstract :
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in the WR-03 waveguide band (220-325 GHz). The impact of waveguide and membrane circuit misalignment, as well as waveguide dimension mismatch is investigated. The analysis is performed for the thru-reflect-line (TRL) calibration applied to E-plane split waveguide blocks carrying membrane circuits. The analysis shows a large influence of the waveguide width tolerance on transmission and reflection phase after the TRL calibration. For a 20 mm long rectangular waveguide with a ± 5 μm width tolerance a phase uncertainty as large as ± 45° for reflection and ± 30° for transmission measurements is observed.
Keywords :
S-parameters; calibration; integrated circuits; membranes; rectangular waveguides; sensitivity analysis; submillimetre waves; E-plane split wave-guide blocks; TRL calibrated-parameter measurements; WR-03 waveguide band; frequency 220 GHz to 325 GHz; phase uncertainty; reflection phase; sensitivity analysis; size 20 mm; thru-reflect-line calibration; transmission measurements; transmission phase; waveguide integrated membrane circuits; waveguide width tolerance; Calibration; Optical waveguides; Sensitivity analysis; Standards; Waveguide transitions; Calibration; measurements; membrane; monolithic integrated circuits (MICs); scattering parameters; sensitivity analysis; submillimeter wave; terahertz (THz); thru-reflect-line (TRL); vector network analyzer (VNA);
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
DOI :
10.1109/TTHZ.2013.2274371
