• DocumentCode
    1761139
  • Title

    A Noise-Immune High-Speed Readout Circuit for In-Cell Touch Screen Panels

  • Author

    Jun-Hyeok Yang ; Seung-Chul Jung ; Young-Suk Son ; Seung-Tak Ryu ; Gyu-Hyeong Cho

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
  • Volume
    60
  • Issue
    7
  • fYear
    2013
  • fDate
    41456
  • Firstpage
    1800
  • Lastpage
    1809
  • Abstract
    Delta-Integration, a novel readout method, is introduced in an effort to solve the noise and speed issues impeding the performance of in-cell touch screen panels. In the proposed method, a differential sensing scheme effectively cancels common noise components and locally occurring noise is spatially low-pass filtered. Due to the consequently enhanced Signal- to-Noise Ratio, the proposed scheme is simply implemented by a comparator and a counter only in place of a complex ADC. The comparator is designed to have a `dead-zone´ for noise-immune characteristics. In addition, a new global charge amplifier that has much wider bandwidth and higher current-driving capability than the conventional one is proposed for high speed operation. The prototype chip consumes a static power of 1.15 mW and the total chip area without panel loads is 2.5 mm2.
  • Keywords
    analogue-digital conversion; circuit noise; comparators (circuits); low-pass filters; readout electronics; tactile sensors; touch sensitive screens; wideband amplifiers; ADC; charge amplifier; comparator; current-driving capability; delta-integration; differential sensing scheme; in-cell touch screen panel; noise cancellation; noise-immune high-speed readout circuit; power 1.15 mW; signal-to-noise ratio; spatial low-pass filter; Capacitance; Capacitors; Feedback amplifier; Noise; Radiation detectors; Tactile sensors; Charge amplifier; delta-integration; in-cell; noise; touch screen panel;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2012.2230494
  • Filename
    6481481