• DocumentCode
    1761336
  • Title

    Field Reliability Estimation for Cochlear Implants

  • Author

    Tessa, Liliane L. ; Sood, Bhanu P. ; Pecht, Michael G.

  • Author_Institution
    Center for Adv. Life Cycle Eng., Univ. of Maryland, College Park, MD, USA
  • Volume
    62
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    2062
  • Lastpage
    2069
  • Abstract
    Cochlear implants are electronic devices used to provide useful hearing sensations to patients with severe to profound hearing loss. Safety and reliability are considered by patients and clinicians when selecting among the different models of cochlear implants. However, comparing reliability estimates from different manufacturers is difficult because of the lack of a standardized approach for classifying and quantifying failure data. This paper develops a classification scheme for cochlear implant failures wherein each failure report is categorized based on the failure site, cause, mode, and mechanism obtained through failure modes, mechanisms, and effects analysis. Failure parameters based on the Weibull distribution are used to quantify the following reliability metrics: B1, B5, B10, and B50 lives. The developed reporting scheme provides clear and quantitative information on failure causes and failure sites for a given implant. This method provides a consistent reporting format for communicating field reliability to regulatory units, clinicians, and patients.
  • Keywords
    Weibull distribution; cochlear implants; failure analysis; reliability; Weibull distribution; classification scheme; cochlear implant failure; electronic device; failure cause; failure effect analysis; failure mechanism; failure mode; failure parameter; failure site; field reliability estimation; hearing loss; hearing sensation; Cochlear implants; Corrosion; Electrodes; Failure analysis; Reliability; Surgery; Cochlear implants; cochlear implants; field failures; reliability;
  • fLanguage
    English
  • Journal_Title
    Biomedical Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9294
  • Type

    jour

  • DOI
    10.1109/TBME.2015.2412127
  • Filename
    7058346