• DocumentCode
    1761413
  • Title

    Analysis, Design, Modeling, and Characterization of Low-Loss Scalable On-Chip Transformers

  • Author

    Tiemeijer, Luuk F. ; Pijper, Ralf M. T. ; Andrei, Cristian ; Grenados, E.

  • Author_Institution
    NXP Central R&D, Eindhoven, Netherlands
  • Volume
    61
  • Issue
    7
  • fYear
    2013
  • fDate
    41456
  • Firstpage
    2545
  • Lastpage
    2557
  • Abstract
    A few important design choices for a low-loss scalable on-chip transformer are discussed, the most important one being that the capacitive and inductive couplings should be aligned to minimize insertion loss. The importance of these design choices is illustrated both theoretically as well as experimentally. In particular, for the first time the performance of these on-chip transformers is verified with four-port S -parameter measurements taken up to 67 GHz. With that, an insertion loss of only 0.6 dB up to 30 GHz is demonstrated. To facilitate the use of these low-loss on-chip transformers in the RF integrated-circuit design flow, a scalable compact equivalent-circuit model suitable for all pre-layout circuit simulations is described, which accurately predicts transformation ratios, transmission efficiencies and balun amplitude and phase imbalances.
  • Keywords
    S-parameters; equivalent circuits; integrated circuit design; radiofrequency integrated circuits; transformers; RF integrated-circuit design flow; balun amplitude; capacitive-inductive couplings; four-port S -parameter measurements; insertion loss; low-loss scalable on-chip transformer analysis; low-loss scalable on-chip transformer characterization; low-loss scalable on-chip transformer design; low-loss scalable on-chip transformer modeling; phase imbalances; pre-layout circuit simulations; scalable compact equivalent-circuit model; transformation ratios; transmission efficiencies; Calibration; de-embedding; on-wafer microwave measurements; transformer design and modeling;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2013.2265684
  • Filename
    6528020