Title :
Uncertainty Analysis in EVM Measurement Using a Monte Carlo Simulation
Author :
Chihyun Cho ; Joo-Gwang Lee ; Jeong-Hwan Kim ; Dae-Chan Kim
Author_Institution :
Div. of Phys. Metrol., Korea Res. Inst. of Stand. & Sci., Daejeon, South Korea
Abstract :
This paper proposes an error vector magnitude (EVM) measurement method for a wideband code-division multiple-access source using a real-time oscilloscope. The EVM values are extracted from the measured waveform using a signal processing that finds the appropriate carrier phase and symbol timing. Measurement uncertainty is also evaluated based on a Monte Carlo simulation, where the errors from the real-time oscilloscope and the signal processing are taken into account. The measured EVM of a source at 900 MHz is (0.2586 ± 0.0040)%, (0.2617 ± 0.0060)%, and (0.2543 ± 0.0078)% at 95% confidence level when the real-time oscilloscope has a bandwidth of 2, 4, and 20 GHz, respectively.
Keywords :
Monte Carlo methods; code division multiple access; electric variables measurement; measurement errors; measurement uncertainty; oscilloscopes; signal processing; EVM measurement uncertainty; Monte Carlo simulation; bandwidth 2 GHz; bandwidth 20 GHz; bandwidth 4 GHz; carrier phase; error vector magnitude; frequency 900 MHz; measurement errors; real-time oscilloscope; signal processing; symbol timing; wideband code division multiple access source; Jitter; Measurement uncertainty; Monte Carlo methods; Noise; Timing; Uncertainty; Code division multiplexing; digital modulation; error vector magnitude (EVM); measurement uncertainty; phase-shift keying; phase-shift keying.;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2015.2406058