Relating Critical Currents to Defect Populations in Superconductors

Analyzing critical currents from an information theoretic or statistical point of view allows one to identify distinct populations of microstates contributing to the critical current under particular conditions of temperature and applied field. We show how this knowledge can be correlated with the known microstructure of a sample to identify how different physical populations of pinning centers are contributing to these statistical populations of microstates. We will then show that by tracking the variation of critical current with temperature, field, and field angle we can construct a picture of the relative contributions of different defect populations under different conditions. We particularly focus our analysis on YBCO thin film coated conductors with potential commercial application.