• DocumentCode
    1762014
  • Title

    A Procedure for Alternate Test Feature Design and Selection

  • Author

    Barragan, Manuel J. ; Leger, Gildas

  • Volume
    32
  • Issue
    1
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    18
  • Lastpage
    25
  • Abstract
    This paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set of parameters to be considered for design as well as to be observed subsequently. The notion of signatures is introduced, and their ability to predict design accuracy is analyzed. The application is demonstrated for an RF LNA circuit.
  • Keywords
    integrated circuit design; integrated circuit testing; low noise amplifiers; radiofrequency integrated circuits; RF LNA circuit; alternate test feature design; design accuracy; Analog circuits; Computational modeling; Envelope detectors; Machine learning algorithms; Mixed analog digital integrated circuits; Monte Carlo methods; Predictive models; Radio frequency; System-on-chip; Alternate Test; feature design; feature selection; machine learning;
  • fLanguage
    English
  • Journal_Title
    Design & Test, IEEE
  • Publisher
    ieee
  • ISSN
    2168-2356
  • Type

    jour

  • DOI
    10.1109/MDAT.2014.2361722
  • Filename
    6917033
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1762014