Title :
In Situ Power Gating Efficiency Learner for Fine-Grained Self-Adaptive Power Gating
Author :
Trivedi, Amit Ranjan ; Wen Yueh ; Mukhopadhyay, Saibal
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A low-power in situ learner circuit is presented to characterize the tradeoff between leakage saving and transition energy overhead in power gating (PG). A self-adaptive PG scheme is demonstrated that utilizes the learner circuit to adaptively invoke PG only when leakage saving is more than the transition energy overhead. A 130-nm test chip demonstrates functionality of the learner circuit and its application to adaptive PG under varying process, temperature, and idle signal pattern.
Keywords :
integrated circuit testing; low-power electronics; PG scheme; fine-grained self-adaptive power gating; idle signal pattern; leakage saving; low-power in situ learner circuit; power gating efficiency learner; size 130 nm; temperature; transition energy overhead; varying process; Heating; Logic gates; Noise; Power measurement; Temperature measurement; Temperature sensors; Transistors; Adaptation; online test circuit; power gating (PG);
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2014.2312635