DocumentCode :
1762185
Title :
Digital Analog Design: Enabling Mixed-Signal System Validation
Author :
Byong Chan Lim ; Mao, James ; Horowitz, Mark ; Ji-Eun Jang ; Jaeha Kim
Author_Institution :
Stanford Univ., Stanford, CA, USA
Volume :
32
Issue :
1
fYear :
2015
fDate :
Feb. 2015
Firstpage :
44
Lastpage :
52
Abstract :
This paper proposes a method to validate mixed-signal circuits and systems using procedures similar to those used for digital model of the transistor implementation, the suitability of the design can be judged. The significance of this work is how these models are constructed and compared, and how this information is managed using existing digital CAD tools. Since analog test program content is typically compiled based on the specifications in the data sheet for the analog circuit, often without the benefit of fault coverage information, there are frequent redundancies in the overall test process.
Keywords :
electronic design automation; integrated circuit design; integrated circuit modelling; integrated circuit testing; mixed analogue-digital integrated circuits; transistor circuits; analog circuit; analog test program content; digital CAD tools; digital analog design; digital model; fault coverage information; mixed-signal circuits; mixed-signal system validation; Analog circuits; Formal verification; Linear systems; Mathematical model; Mixed analog digital integrated circuits; System-on-chip; Testing; Analog validation; SystemVerilog; behavioral modeling; design methodology; equivalence checking; event-driven simulation; linear abstraction; test vector generation;
fLanguage :
English
Journal_Title :
Design & Test, IEEE
Publisher :
ieee
ISSN :
2168-2356
Type :
jour
DOI :
10.1109/MDAT.2014.2361718
Filename :
6917049
Link To Document :
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