• DocumentCode
    176259
  • Title

    Software Defect Prediction for LSI Designs

  • Author

    Parizy, Matthieu ; Takayama, K. ; Kanazawa, Yuji

  • Author_Institution
    Design Eng. Lab., FUJITSU Labs. Ltd., Kawasaki, Japan
  • fYear
    2014
  • fDate
    Sept. 29 2014-Oct. 3 2014
  • Firstpage
    565
  • Lastpage
    568
  • Abstract
    While mining software repositories is a field which has greatly grown over the last ten years, Large Scale Integrated circuit (LSI) design repository mining has yet to reach the momentum of software´s. We felt that it represents untouched potential especially for defect prediction. In an LSI, referred to as hardware later on, verification has a high cost compared to design. After studying existing software defect prediction techniques based on repository mining, we decided to adapt some for hardware design repositories in the hope of saving precious resources by focusing design and verification effort on the most defect prone parts of the design. By focusing our resources on the previously mentioned parts, we hope to improve our designs quality. We discuss how we applied these prediction techniques to hardware and show our results are promising for the future of hardware repository mining. Our results allowed us to estimate a possible total verification time reduction of 12%.
  • Keywords
    electronic design automation; integrated circuit design; large scale integration; LSI design; hardware design repository; hardware repository mining; large scale integrated circuit; software defect prediction; Correlation; Data mining; Entropy; Hardware; Hardware design languages; Measurement; Software; LSI; code change; code metrics; defect prediction; hardware; repository mining;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Maintenance and Evolution (ICSME), 2014 IEEE International Conference on
  • Conference_Location
    Victoria, BC
  • ISSN
    1063-6773
  • Type

    conf

  • DOI
    10.1109/ICSME.2014.96
  • Filename
    6976140