DocumentCode
176259
Title
Software Defect Prediction for LSI Designs
Author
Parizy, Matthieu ; Takayama, K. ; Kanazawa, Yuji
Author_Institution
Design Eng. Lab., FUJITSU Labs. Ltd., Kawasaki, Japan
fYear
2014
fDate
Sept. 29 2014-Oct. 3 2014
Firstpage
565
Lastpage
568
Abstract
While mining software repositories is a field which has greatly grown over the last ten years, Large Scale Integrated circuit (LSI) design repository mining has yet to reach the momentum of software´s. We felt that it represents untouched potential especially for defect prediction. In an LSI, referred to as hardware later on, verification has a high cost compared to design. After studying existing software defect prediction techniques based on repository mining, we decided to adapt some for hardware design repositories in the hope of saving precious resources by focusing design and verification effort on the most defect prone parts of the design. By focusing our resources on the previously mentioned parts, we hope to improve our designs quality. We discuss how we applied these prediction techniques to hardware and show our results are promising for the future of hardware repository mining. Our results allowed us to estimate a possible total verification time reduction of 12%.
Keywords
electronic design automation; integrated circuit design; large scale integration; LSI design; hardware design repository; hardware repository mining; large scale integrated circuit; software defect prediction; Correlation; Data mining; Entropy; Hardware; Hardware design languages; Measurement; Software; LSI; code change; code metrics; defect prediction; hardware; repository mining;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Maintenance and Evolution (ICSME), 2014 IEEE International Conference on
Conference_Location
Victoria, BC
ISSN
1063-6773
Type
conf
DOI
10.1109/ICSME.2014.96
Filename
6976140
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