Title :
Flexible High-
/Metal Gate Metal/Insulator/Metal Capacitors on Silicon (100) Fabric
Author :
Rojas, Jhonathan P. ; Ghoneim, M.T. ; Young, Chadwin D. ; Hussain, M.M.
Author_Institution :
Electr. Eng. Program, King Abdullah Univ. of Sci. & Technol., Thuwal, Saudi Arabia
Abstract :
Implementation of memory on bendable substrates is an important step toward a complete and fully developed notion of mechanically flexible computational systems. In this paper, we have demonstrated a simple fabrication flow to build metal-insulator-metal capacitors, key components of dynamic random access memory, on a mechanically flexible silicon (100) fabric. We rely on standard microfabrication processes to release a thin sheet of bendable silicon (area: 18 cm2 and thickness: 25 μm) in an inexpensive and reliable way. On such platform, we fabricated and characterized the devices showing mechanical robustness (minimum bending radius of 10 mm at an applied strain of 83.33% and nominal strain of 0.125%) and consistent electrical behavior regardless of the applied mechanical stress. Furthermore, and for the first time, we performed a reliability study suggesting no significant difference in performance and showing an improvement in lifetime projections.
Keywords :
MIM devices; capacitors; circuit reliability; elemental semiconductors; microfabrication; random-access storage; silicon; Si; bendable silicon substrate; distance 10 mm; flexible high-κ-metal gate metal-insulator-metal capacitor; mechanical robustness; mechanical stress; mechanically flexible computational system; mechanically flexible silicon fabric; random access memory; reliability; size 25 mum; standard microfabrication processing; thin sheet; Capacitors; Fabrics; Metals; Reliability; Silicon; Substrates; Bending curvature; flexible; high $k$; metal gate; metal–insulator–metal capacitors (MIMCAPs); silicon (100);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2013.2278186