• DocumentCode
    1763858
  • Title

    NAND Flash Innovations

  • Author

    Aritome, Seiichi

  • Author_Institution
    R&D Div., SK Hynix, Icheon, South Korea
  • Volume
    5
  • Issue
    4
  • fYear
    2013
  • fDate
    Fall 2013
  • Firstpage
    21
  • Lastpage
    29
  • Abstract
    Recent progress in mobile equipments (ex. smartphone and tablet-PC) requires further effort in developing higher density and higher reliability nonvolatile semiconductor memories. A breakthrough in the field of nonvolatile memories was the invention of the Flash memory by Prof. Fujio Masuoka [1]. The Flash memory had many advantages in comparison with other nonvolatile memories. Therefore, the development of Flash memory has been explosively accelerated.
  • Keywords
    NAND circuits; circuit reliability; flash memories; random-access storage; NAND flash innovations; flash memory; mobile equipments; nonvolatile semiconductor memories; reliability; Flash memories; Mobile communication; Mobile handsets; Nonvolatile memory; Semiconductor memory; Smart phones;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1943-0582
  • Type

    jour

  • DOI
    10.1109/MSSC.2013.2278083
  • Filename
    6670214