• DocumentCode
    1763887
  • Title

    Configurable Circuits Featuring Dual-Threshold-Voltage Design With Three-Independent-Gate Silicon Nanowire FETs

  • Author

    Jian Zhang ; Xifan Tang ; Gaillardon, Pierre-Emmanuel ; De Micheli, G.

  • Author_Institution
    Integrated Syst. Lab. (LSI), Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
  • Volume
    61
  • Issue
    10
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    2851
  • Lastpage
    2861
  • Abstract
    Silicon nanowire transistors with Schottky-barrier contacts exhibit both n-type and p-type characteristics under different bias conditions. Polarity controllability of silicon nanowire transistors has been further demonstrated by using an additional polarity gate. The device can be configured as n-type or p-type by controlling the polarity gate voltage. This paper extends this approach by using three independent gates and shows its interest to implement dual-threshold-voltage configurable circuits. Polarity and threshold voltage of uncommitted devices are determined by applying different bias patterns to the three gates. Uncommitted logic gates can thus be configured to implement different logic functions, targeting either high-performance or low-leakage applications. Dual-threshold-voltage design is thereby achievable through the use of a wiring scheme on an uncommitted pattern. With the polarity controllability of the three-independent-gate device, a range of logic functions is also obtained by replacing VDD and GND by complementary input signals. Synthesis results of ISCAS´85 and VTR sequential benchmark circuits with these devices show, before place and route, comparable performance and 51% reduction of leakage power consumption compared to 22-nm low-standby-power FinFET technology.
  • Keywords
    MOSFET; Schottky barriers; elemental semiconductors; field effect transistors; nanowires; semiconductor device models; sequential circuits; silicon; FinFET technology; ISCAS´85; Schottky-barrier contacts; Si; VTR sequential benchmark circuits; dual-threshold-voltage configurable circuits; dual-threshold-voltage design; logic functions; logic gates; power consumption; silicon nanowire transistors; size 22 nm; Logic gates; Performance evaluation; Power demand; Schottky barriers; Silicon; Threshold voltage; Transistors; Ambipolar; configurable; dual-threshold-voltage; silicon nanowire;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2014.2333675
  • Filename
    6858094