• DocumentCode
    1763961
  • Title

    A Novel Saliency Detection Method for Lunar Remote Sensing Images

  • Author

    Hui-Zhong Chen ; Ning Jing ; Jun Wang ; Yong-Guang Chen ; Luo Chen

  • Author_Institution
    Dept. of Electron. Sci. & Eng., Nat. Univ. of Defense Technol., Changsha, China
  • Volume
    11
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan. 2014
  • Firstpage
    24
  • Lastpage
    28
  • Abstract
    The saliency detection provides an alternative methodology to semantic image understanding in many applications, for example, content-based image retrieval. To detect saliency for lunar remote sensing images, this letter proposes a crater feature model by analyzing the relationship between local interest points and saliency of lunar images. Based on the model, we propose a novel saliency detection method for lunar images. Our method merges and combines the speed-up robust feature features of the highlight region and shadow region of an impact crater to get the candidate regions of interest (ROI). Then, a descriptive feature vector is generated for each ROI, and the resulting saliency regions are distinguished from false detected and inconspicuous ones through a support vector machine. The method has been put into test on Chang´e-1 and Chang´e-2 lunar image data, and confirmed to be able to detect the salient region of impact craters correctly, with results much better than those obtained by the classical saliency detection method.
  • Keywords
    lunar surface; planetary remote sensing; support vector machines; Chang´e-1 lunar image data; Chang´e-2 lunar image data; impact crater; lunar exploration; lunar remote sensing images; novel saliency detection method; regions of interest; support vector machine; Feature extraction; Image retrieval; Moon; Remote sensing; Support vector machines; Vectors; Visualization; Lunar image; saliency detection; speed-up robust feature (SURF); support vector machine (SVM);
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2013.2244845
  • Filename
    6482591