Influence of Cracks in the Superconductor Layers Caused by Mechanical Stresses on Critical Currents and AC Transport Losses in YBCO CCs

Author

Isozaki, Kousuke ; Noda, Toshio ; Iwasaki, Shoichi ; Honzawa, R. ; Ojima, T. ; Takao, Tomoaki ; Iida, Yuki ; Ogino, Tadashi ; Tsukamoto, Osami

Author_Institution

Fac. of Sci. & Technol., Sophia Univ., Tokyo, Japan

Volume

23

Issue

3

fYear

2013

fDate

41426

Firstpage

6601504

Lastpage

6601504

Abstract

Influence of mechanical stresses on critical currents and ac transport losses in YBCO CCs with copper stabilization layers is investigated by ac loss measurement and SEM observation of surfaces of YBCO layers. Tested YBCO strips were made by slitting mechanically a wide tape. Cracks caused by the slitting were found in the YBCO layer even in the virgin strips in the edge side areas. Mechanical stresses to strips widen and grow those original cracks. In the paper, the characteristics of critical current and ac transport current losses depending on mechanical stresses are explained in relation to features of the cracks.

Keywords

barium compounds; cracks; critical currents; high-temperature superconductors; scanning electron microscopy; superconducting tapes; tensile strength; yttrium compounds; SEM; YBCO; YBCO coated conductor; YBCO strips; YBCO tape; ac transport losses; copper stabilization layers; cracks; critical currents; edge side areas; mechanical stresses; scanning electron microscopy; superconductor layers; tensile stress; virgin strips; Critical current; Loss measurement; Strain; Strips; Tensile stress; Yttrium barium copper oxide; AC losses; SEM; YBCO coated conductor; copper layer; cracks; repeated tensile stress;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2012.2235496

Filename

6389724