DocumentCode
1764031
Title
Spectral Domain Analysis of Open Single and Coupled Microstrip Lines With Polygonal Cross-Section in Bound and Leaky Regimes
Author
Coluccini, G. ; Lucido, Mario ; Panariello, Gaetano
Author_Institution
MBDA Italia S.p.A., Rome, Italy
Volume
61
Issue
2
fYear
2013
fDate
Feb. 2013
Firstpage
736
Lastpage
745
Abstract
Aim of this work is the analysis of the propagation of bound and leaky modes in perfectly conducting open single and coupled microstrip lines with polygonal cross-section. The problem is formulated as a new numerically stable one-dimensional electric field integral equation (EFIE) in the spectral domain. Quick convergence is achieved by expanding the unknown surface current density with functions reconstructing the edge behaviour and continuity conditions in a Galerkin scheme. Due to the reciprocity, the impedance matrix has symmetries allowing to cut down the number of coefficients to be numerically evaluated. The choice of analytically Fourier transformable expansion functions leads to reduce the coefficients of the impedance matrix to single integrals efficiently evaluated by means of an analytical acceleration technique.
Keywords
Galerkin method; current density; electric field integral equations; microstrip lines; Fourier transformable expansion functions; Galerkin scheme; analytical acceleration technique; bound regimes; coupled microstrip lines; edge behaviour; electric field integral equation; leaky regimes; open single; polygonal cross-section; quick convergence; spectral domain analysis; unknown surface current density; Convergence; Impedance; Integral equations; Microstrip; Spectral analysis; Surface impedance; Transmission line matrix methods; Microstrip lines; polygonal cross-section; spectral domain analysis;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2012.2231424
Filename
6389731
Link To Document