A Flexible TFT Circuit Yield Optimizer Considering Process Variation, Aging, and Bending Effects

Author

Wen-En Wei ; Hung-Yi Li ; Cheng-Yu Han ; Li, James Chien-Mo ; Jian-Jang Huang ; I-Chun Cheng ; Chien-Nan Liu ; Yung-Hui Yeh

Author_Institution

Nat. Taiwan Univ., Taipei, Taiwan

Volume

10

Issue

12

fYear

2014

fDate

Dec. 2014

Firstpage

1055

Lastpage

1063

Abstract

This paper presents a yield optimization tool, FlexiOptimizer , for flexible thin-film transistor (TFT) circuits. FlexiOptimizer considers three important effects: (1) process variation; (2) aging effect; and (3) bending effect. This SPICE-based optimizer applies response surface methodology (RSM) and orthogonal array (OA) techniques to size transistors so the yield is improved in aged and bent condition. This tool is demonstrated on two different designs: organic light emitting diode (OLED) pixel drivers and differential operational amplifiers (OPAMPs), in both amorphous silicon (a-Si) and Indium-Gallium-Zinc-Oxide (IGZO) TFT technologies.

Keywords

SPICE; ageing; bending; circuit optimisation; flexible electronics; response surface methodology; thin film transistors; transistor circuits; FlexiOptimizer; IGZO; OA; OLED pixel drivers; OPAMPs; RSM; SPICE-based optimizer; aging effect; amorphous silicon TFT technology; bending effects; differential operational amplifiers; flexible TFT circuit yield optimizer tool; indium-gallium-zinc-oxide TFT technologies; organic light emitting diode; orthogonal array techniques; process variation; response surface methodology; thin-film transistor; Aging; Fitting; Integrated circuit modeling; Mathematical model; Optimization; Organic light emitting diodes; Thin film transistors; Analog circuit optimization; flexible TFT; orthogonal array; response surface methodology;

fLanguage

English

Journal_Title

Display Technology, Journal of

Publisher

ieee

ISSN

1551-319X

Type

jour

DOI

10.1109/JDT.2014.2340892

Filename

6860224