• DocumentCode
    1764649
  • Title

    Analytical Model for the Inversion Gate Capacitance of DG and UTBB MOSFETs at the Quantum Capacitance Limit

  • Author

    Hiblot, Gaspard ; Rafhay, Quentin ; Boeuf, Frederic ; Ghibaudo, Gerard

  • Author_Institution
    STMicroelectron., Crolles, France
  • Volume
    62
  • Issue
    5
  • fYear
    2015
  • fDate
    42125
  • Firstpage
    1375
  • Lastpage
    1382
  • Abstract
    In this paper, a model of gate capacitance is proposed for ultrathin-body-BOX and double-gate MOSFETs with light mass channel materials. First, the model is derived by making the assumption that only one subband is occupied and using quantum perturbation theory to compute the corresponding energy level. Next, this model is confirmed with Poisson-Schrödinger simulations. Finally, the impacts in terms of performance and scaling are discussed.
  • Keywords
    MOSFET; Schrodinger equation; perturbation theory; stochastic processes; DG MOSFET; Poisson-Schrödinger simulations; UTBB MOSFET; analytical model; double-gate; energy level; inversion gate capacitance; light mass channel materials; quantum capacitance limit; quantum perturbation theory; ultrathin-body-BOX; Energy states; Equations; Logic gates; MOSFET; Mathematical model; Quantum capacitance; III--V; III???V; compact model; double gate (DG); quantum capacitance; ultrathin-body BOX (UTBB); ultrathin-body BOX (UTBB).;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2406116
  • Filename
    7060694