• DocumentCode
    1764777
  • Title

    Adaptive and Resilient Circuits for Dynamic Variation Tolerance

  • Author

    Bowman, Keith A. ; Tokunaga, Carlos ; Tschanz, James W. ; Karnik, Tanay ; De, Vivek K.

  • Author_Institution
    Intel, Hillsboro, OR, USA
  • Volume
    30
  • Issue
    6
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    8
  • Lastpage
    17
  • Abstract
    This paper focuses on techniques to build more effective circuits for dynamic variation tolerance. Three main approaches are presented based on adaptive circuits, error detection and recovery techniques, and adaptive clock distribution. The tradeoffs in effectiveness and overhead of these different solutions are discussed.
  • Keywords
    clock and data recovery circuits; microprocessor chips; adaptive circuits; adaptive clock distribution; dynamic variation tolerance; error detection; recovery techniques; resilient circuits; Aging; Equipment; Fault tolerance; Resilience; Temperature measurement; Temperature sensors; Throughput; Adaptive circuit; adaptive clock distribution; resilient circuit; variation tolerance;
  • fLanguage
    English
  • Journal_Title
    Design & Test, IEEE
  • Publisher
    ieee
  • ISSN
    2168-2356
  • Type

    jour

  • DOI
    10.1109/MDAT.2013.2267958
  • Filename
    6530608
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1764777