• DocumentCode
    1764779
  • Title

    An Analysis of Industrial SRAM Test Results—A Comprehensive Study on Effectiveness and Classification of March Test Algorithms

  • Author

    Linder, Michael ; Eder, Alfred ; Schlichtmann, Ulf ; Oberlander, Klaus

  • Volume
    31
  • Issue
    3
  • fYear
    2014
  • fDate
    41791
  • Firstpage
    42
  • Lastpage
    53
  • Abstract
    This paper deals with efficient test algorithm identification of embedded SRAMs. The approach is based on silicon test results of automotive microcontroller devices, which tries to identify efficient tests by removing unnecessary test patterns that cover the same subset of faults. Results of an industrial case under 29 test algorithms and a large amount of chips are obtained; among them, efficient ones are identified.
  • Keywords
    SRAM chips; automotive electronics; embedded systems; microcontrollers; testing; automotive microcontroller devices; embedded SRAM; industrial SRAM test; march test algorithms; silicon test results; Algorithm design and analysis; Classification algorithms; Cloud computing; Embedded systems; Fault detection; Heuristic algorithms; Microcontrollers; Random access memory; Classification; Functional Fault Models; March Algorithms; SRAM test;
  • fLanguage
    English
  • Journal_Title
    Design & Test, IEEE
  • Publisher
    ieee
  • ISSN
    2168-2356
  • Type

    jour

  • DOI
    10.1109/MDAT.2013.2279752
  • Filename
    6587484
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1764779