Title :
SEU Sensitivity Comparison for Different Reprogrammable Technologies With Minority Check Block
Author :
Vaskova, A. ; Lopez-Ongil, C. ; Portela-Garcia, M. ; Garcia-Valderas, M. ; Entrena, L.
Author_Institution :
Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
Abstract :
In this work, a method is proposed for obtaining comparable measurements of the SEU sensitivity in reprogrammable devices that present different characteristics like internal architecture, technology, amount of available resources, etc. A specific minority checker is developed for reporting the presence of SEUs or MBUs which will help in this comparing task during dynamic tests.
Keywords :
field programmable gate arrays; radiation hardening (electronics); MBU; SEU sensitivity comparison; dynamic test; minority check block; reprogrammable devices; reprogrammable technology; Circuit faults; Clocks; Field programmable gate arrays; Performance evaluation; Radiation effects; Robustness; Sensitivity; Cross section; MBU; SEU; fault injection campaigns; reprogrammable devices;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2245343
