DocumentCode :
1764887
Title :
Maximizing Nanotechnology Education at Purdue University: Its Integration into the Electrical Engineering Technology Curriculum
Author :
McNally, Helen A.
Author_Institution :
Dept. of Electr. & Comput. Eng. Tech, Purdue Univ., West Lafayette, IN, USA
Volume :
7
Issue :
3
fYear :
2013
fDate :
Sept. 2013
Firstpage :
19
Lastpage :
22
Abstract :
Nanotechnology education continues to be a national priority [5], [12] while requiring an integration of the basic disciplines (physics, chemistry, and biology) into the systems of engineering and technology. Training the next-generation workforce in this complex and highly interdisciplinary field presents many opportunities and challenges. Various nanotechnology courses and programs [1], [4], [15] have been developed with differing levels of success. The issues of prerequisite material, student selective interests, and program-specific requirements are a few of the challenges that have slowed the rate of nanotechnology education. Also, access to and training on scanning probe microscopes (SPMs), one of the premier tools of nanotechnology [2], has been limited, particularly at the undergraduate level. A few laboratories [7], [13] have been centered around the atomic force microscope (AFM), a subset of the SPM. However, these systems are expensive, and it is a challenge to retain the expertise necessary to maintain, operate, and train students on these systems.
Keywords :
atomic force microscopy; electrical engineering education; further education; nanotechnology; AFM; Purdue University; SPM; atomic force microscope; electrical engineering technology curriculum; nanotechnology course; nanotechnology education; next-generation workforce; program-specific requirement; scanning probe microscope; student selective interest; student training; undergraduate level; Educational institutions; Engineering education; Microscopy; Nanoscale devices; Nanotechnology;
fLanguage :
English
Journal_Title :
Nanotechnology Magazine, IEEE
Publisher :
ieee
ISSN :
1932-4510
Type :
jour
DOI :
10.1109/MNANO.2013.2275026
Filename :
6587496
Link To Document :
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