Title :
Improving the Quality of Prediction Intervals Through Optimal Aggregation
Author :
Hosen, Mohammad Anwar ; Khosravi, Abbas ; Nahavandi, Saeid ; Creighton, Douglas
Author_Institution :
Centre for Intell. Syst. Res., Deakin Univ., Burwood, VIC, Australia
Abstract :
Neural networks (NNs) are an effective tool to model nonlinear systems. However, their forecasting performance significantly drops in the presence of process uncertainties and disturbances. NN-based prediction intervals (PIs) offer an alternative solution to appropriately quantify uncertainties and disturbances associated with point forecasts. In this paper, an NN ensemble procedure is proposed to construct quality PIs. A recently developed lower-upper bound estimation method is applied to develop NN-based PIs. Then, constructed PIs from the NN ensemble members are combined using a weighted averaging mechanism. Simulated annealing and a genetic algorithm are used to optimally adjust the weights for the aggregation mechanism. The proposed method is examined for three different case studies. Simulation results reveal that the proposed method improves the average PI quality of individual NNs by 22%, 18%, and 78% for the first, second, and third case studies, respectively. The simulation study also demonstrates that a 3%-4% improvement in the quality of PIs can be achieved using the proposed method compared to the simple averaging aggregation method.
Keywords :
genetic algorithms; neural nets; prediction theory; simulated annealing; uncertainty handling; NN ensemble members; NN ensemble procedure; NN-based prediction intervals; PI quality; genetic algorithm; lower-upper bound estimation method; neural networks; nonlinear systems; point forecasts; process uncertainties; simulated annealing; weighted averaging mechanism; Artificial neural networks; Cost function; Data models; Inductors; Training; Uncertainty; Aggregation; Neural Network; Prediction interval; Simulated annealing; Uncertainty and disturbance; Weighted average; neural network (NN); prediction interval (PI); simulated annealing (SA); uncertainty and disturbance; weighted average;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2014.2383994