DocumentCode :
1764973
Title :
A 76–84-GHz 16-Element Phased-Array Receiver With a Chip-Level Built-In Self-Test System
Author :
Sang Young Kim ; Inac, Ozgur ; Choul-Young Kim ; Donghyup Shin ; Rebeiz, Gabriel M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California San Diego (UCSD), La Jolla, CA, USA
Volume :
61
Issue :
8
fYear :
2013
fDate :
Aug. 2013
Firstpage :
3083
Lastpage :
3098
Abstract :
This paper presents a 16-element phased-array receiver for 76-84-GHz applications with built-in self-test (BIST) capabilities. The chip contains an in-phase/quadrature (I/Q) mixer suitable for automotive frequency-modulation continuous-wave radar applications, which is also used as part of the BIST system. The chip achieves 4-bit RF amplitude and phase control, an RF to IF gain of 30-35 dB at 77-84 GHz, I/Q balance of and at 76-84 GHz, and a system noise figure of 18 dB. The on-chip BIST covers the 76-84-GHz range and determines, without any calibration, the amplitude and phase of each channel, a normalized frequency response, and can measure the gain control using RF gain control. System-level considerations are discussed together with extensive results showing the effectiveness of the on-chip BIST as compared with standard S-parameter measurements.
Keywords :
CW radar; FM radar; S-parameters; built-in self test; frequency response; gain control; millimetre wave mixers; millimetre wave radar; phase control; phased array radar; 16-element phased-array receiver; BIST system; I/Q balance; RF amplitude; RF gain control; automotive frequency-modulation continuous-wave radar applications; chip-level built-in self-test system; frequency 76 GHz to 84 GHz; gain 30 dB to 35 dB; in-phase/quadrature mixer; noise figure 18 dB; normalized frequency response; on-chip BIST; phase control; standard S-parameter measurements; system noise figure; system-level considerations; word length 4 bit; Automotive radars; built-in self-test (BIST); millimeter-wave integrated circuits; phase shifters; phased arrays; silicon–germanium;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2013.2265016
Filename :
6530630
Link To Document :
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