DocumentCode
1765030
Title
A Quantitative, Experimental Approach to Measuring Processor Side-Channel Security
Author
Demme, John ; Martin, Rashad ; Waksman, Adam ; Sethumadhavan, Simha
Volume
33
Issue
3
fYear
2013
fDate
May-June 2013
Firstpage
68
Lastpage
77
Abstract
User inputs tend to change the execution characteristics of applications including their interactions with cache, network, storage, and other systems. Many attacks have exploited the observable side effects of these execution characteristics to expose sensitive information. In response, researchers have proposed countermeasures to protect against these attacks. However there is currently no systematic, holistic methodology for understanding information leakage. As a result, it is not well known how design decisions affect information leakage or the vulnerability of entire systems to side-channel attacks. The authors propose a metric for measuring information leakage called the Side-channel Vulnerability Factor (SVF). The SVF is based on the observation that all side-channel attacks - ranging from physical to microarchitectural to software - rely on recognizing leaked execution patterns. The SVF quantifies patterns in attackers´ observations and measures their correlation to the victim´s actual execution patterns and in doing so captures systems´ predisposition to leak information. Thus, the SVF provides a quantitative approach to securing computer architecture.
Keywords
cache storage; computer architecture; cryptography; SVF; cache; computer architecture; design decisions; execution characteristics; information leakage; processor side-channel security; quantitative experimental approach; side-channel vulnerability factor; Computer architecture; Data models; Encryption; Information technology; Memory management; Microarchitecture; Pattern recognition; System performance; data; data encryption; hardware; information technology and systems; integration; memory structures; modeling; models and principles; systems and information theory; systems architecture;
fLanguage
English
Journal_Title
Micro, IEEE
Publisher
ieee
ISSN
0272-1732
Type
jour
DOI
10.1109/MM.2013.23
Filename
6484049
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