Title :
A Highly Linear 1 GHz 1.3 dB NF CMOS Low-Noise Amplifier With Complementary Transconductance Linearization
Author :
Bum-Kyum Kim ; Donggu Im ; Jaeyoung Choi ; Kwyro Lee
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
Abstract :
A highly linear LNA is implemented in a 0.18 μm SOI CMOS process for 1 GHz SAW-less receiver applications. To achieve lower noise figure (NF) than conventional simultaneous noise and input matching methods, a capacitive loading based simultaneous noise and input matching technique reducing the NF degradation coming from a lossy gate inductor has been devised. In addition, in order to improve both the 1 dB gain compression point (CP1dB) and the third-order intercept point (IP3) without sacrificing NF, a large-signal transconductance linearization method adopting body-bias control and complementary-superposition is proposed. The proposed LNA shows a measured input-referred CP1dB of 3 dBm, 1 dB desensitization point (B1dB) of 0 dBm and IB (in-band)-IIP3 of 22 dBm with gain of 10.7 dB and NF of 1.3 dB at 1 GHz while driving a 50 Ω load impedance. It draws 20 mA with a buffer stage from a 2.5 V supply voltage.
Keywords :
CMOS analogue integrated circuits; UHF amplifiers; UHF integrated circuits; operational amplifiers; silicon-on-insulator; LNA; NF degradation; SAW-less receiver; SOI CMOS process; body-bias control; buffer stage; capacitive loading based simultaneous noise; complementary transconductance linearization; complementary-superposition; current 2.5 mA; current 20 mA; frequency 1 GHz; gain 1 dB; gain 10.7 dB; gain compression point; highly linear NF CMOS low-noise amplifier; input matching methods; large-signal transconductance linearization method; lossy gate inductor; noise figure; noise figure 1.3 dB; resistance 50 ohm; size 0.18 mum; third-order intercept point; Impedance; Impedance matching; Logic gates; Noise; Noise measurement; Transconductance; Transistors; Blocker; CMOS; MGTR; SAW-less; high linearity; intermodulation distortion; large signal; noise figure; noise matching; nonlinearity; simultaneous matching;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2014.2319262