DocumentCode
1765198
Title
Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process
Author
Man Ho Ling ; Kwok Leung Tsui ; Balakrishnan, Narayanaswamy
Author_Institution
Dept. of Math. & Inf. Technol., Hong Kong Inst. of Educ., Hong Kong, China
Volume
64
Issue
1
fYear
2015
fDate
42064
Firstpage
463
Lastpage
472
Abstract
As most systems these days are highly reliable with long lifetimes, failures of systems become rare; consequently, traditional failure time analysis may not be able to provide a precise assessment of the system reliability. In this regard, a degradation measure, as a percentage of the initial value, is an alternate way of describing the system health. This paper presents accelerated degradation analysis that characterizes the health and quality of systems with monotonic and bounded degradation. The maximum likelihood estimates (MLEs) of the model parameters are derived, based on a gamma process, time-scale transformation, and a power link function for associating the covariates. Then, methods of estimating the reliability, the mean and median lifetime, the conditional reliability, and the remaining useful life of systems under normal use conditions are all described. Moreover, approximate confidence intervals for the parameters of interest are developed based on the observed Fisher information matrix. A model validation metric with exact power is introduced. A Monte Carlo simulation study is carried out for evaluating the performance of the proposed methods. For an illustration of the proposed model, and the methods of inference developed here, a numerical example involving light intensity of light emitting diodes (LED) is analyzed.
Keywords
Monte Carlo methods; failure analysis; gamma distribution; light emitting diodes; matrix algebra; maximum likelihood estimation; reliability theory; remaining life assessment; Fisher information matrix; LED; MLE; Monte Carlo simulation study; accelerated degradation analysis; bounded degradation; conditional reliability; degradation measure; failure time analysis; gamma process; light emitting diodes; light intensity; maximum likelihood estimate; mean lifetime; median lifetime; model parameter; model validation metric; monotonic degradation; performance evaluation; power link function; reliability estimation; system failure; system health; system quality; system reliability; time-scale transformation; Acceleration; Approximation methods; Degradation; Maximum likelihood estimation; Reliability; Standards; Stress; Accelerated degradation analysis; asymptotic confidence interval; gamma process; maximum likelihood estimate; remaining useful life; system health;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2014.2337071
Filename
6860326
Link To Document