• DocumentCode
    1765208
  • Title

    GaN Power Transistor Modeling for High-Speed Converter Circuit Design

  • Author

    Nakajima, Akitoshi ; Takao, Kazuto ; Ohashi, H.

  • Author_Institution
    Adv. Ind. Sci. & Technol., Tsukuba, Japan
  • Volume
    60
  • Issue
    2
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    646
  • Lastpage
    652
  • Abstract
    A circuit simulator has been developed to design power losses of high-frequency power converters using GaN-based heterojunction field-effect transistors (GaN-HFETs). The simulator is based on a high-accuracy equivalent model of GaN-HFETs with peculiar device physics and high-speed loss calculation methods. The simulated power losses were consistent with measured results in dc-dc converters constructed by a GaN-HFET and a SiC Schottky diode with more than 93% accuracy. By utilizing the developed simulator, key requirements in heat-dissipation technologies, circuit parasitic inductances, and gate-drive technologies for next-generation converters are discussed.
  • Keywords
    DC-DC power convertors; III-V semiconductors; Schottky diodes; circuit simulation; cooling; gallium compounds; high-speed integrated circuits; inductance; integrated circuit design; losses; power HEMT; silicon compounds; wide band gap semiconductors; DC-DC converters; GaN; HFET; Schottky diode; SiC; circuit parasitic inductances; circuit simulator; device physics; gate-drive technologies; heat-dissipation technologies; heterojunction field-effect transistors; high-accuracy equivalent model; high-frequency power converters; high-speed converter circuit design; high-speed loss calculation methods; next-generation converters; power transistor modeling; simulated power losses; Capacitance; Current measurement; Gallium nitride; HEMTs; Integrated circuit modeling; Logic gates; MODFETs; GaN; heterojunction field-effect transistor (HFET); power converters; semiconductor device modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2226180
  • Filename
    6392235