DocumentCode
1765226
Title
Analysis of Destructive Degradation Tests for a Product With Random Degradation Initiation Time
Author
Ye Zhang ; Haitao Liao
Author_Institution
Syst. & Ind. Eng. Dept., Univ. of Arizona, Tucson, AZ, USA
Volume
64
Issue
1
fYear
2015
fDate
42064
Firstpage
516
Lastpage
527
Abstract
Most research on degradation models and analyses focuses on nondestructive degradation test data. In practice, destructive tests are often conducted to gain insights into the changes of the physical properties of products or materials over time. Such tests sometimes provide more reliable degradation information than nondestructive tests that may only yield indirect degradation measures, such as temperature, amount of metal particles, and vibration. However, an obvious drawback of destructive tests is that only one measurement can be obtained from each specimen. Moreover, some products start degrading only after a random degradation initiation time that is often not even observable in destructive degradation tests (DDTs). Such a degradation-free period adds another dimension of complexity in modeling DDT data. In this paper, we develop two delayed-degradation models based on DDT data to evaluate the reliability of a product with an exponentially distributed degradation initiation time. For homogeneous and heterogeneous populations, fixed-effects and random-effects Gamma processes are considered, respectively, in modeling the actual degradation of units after degradation initiation. A maximum likelihood method as well as an expectation-maximization algorithm is developed to estimate the model parameters, and bootstrap methods are used to obtain the confidence intervals of the interested reliability indices. Numerical examples demonstrate that the proposed models and estimation methods are effective in analyzing DDT involving random degradation initiation times.
Keywords
expectation-maximisation algorithm; gamma distribution; materials testing; parameter estimation; product quality; reliability; DDT; bootstrap method; confidence interval; destructive degradation test; expectation-maximization algorithm; gamma process; maximum likelihood method; model parameter estimation; product reliability; random degradation initiation time; Analytical models; Data models; Degradation; Maximum likelihood estimation; Reliability; Temperature measurement; Time measurement; Destructive degradation test; maximum likelihood; random initiation time;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2014.2336411
Filename
6860330
Link To Document