Title :
A New Method for Measuring the Properties of Dielectric Materials
Author :
Jingchu Han ; Wen Geyi
Author_Institution :
Dept. of Commun. Sci. & Eng., Fudan Univ., Shanghai, China
Abstract :
This letter proposes a new method for determining the properties of dielectric materials. A dielectric sample in free space illuminated by an incident field from a nearby antenna produces a scattered field, which will affect the input impedance of the antenna. The change of the input impedance of the antenna can then be used to determine the permittivity and the loss of the dielectric sample. The measurement setup using a microstrip antenna has been examined in detail. Experimental results have been presented to demonstrate the feasibility and validity of the proposed method.
Keywords :
dielectric loss measurement; dielectric materials; electric impedance; electromagnetic wave scattering; microstrip antennas; permittivity; antenna input impedance; dielectric material property measurement; dielectric sample loss; incident field; microstrip antenna; permittivity; scattered field; Antenna measurements; Dielectric loss measurement; Dielectrics; Microstrip antennas; Permittivity; Permittivity measurement; Dielectric sample; input impedance; loss tangent; permittivity;
Journal_Title :
Antennas and Wireless Propagation Letters, IEEE
DOI :
10.1109/LAWP.2013.2254104
