Analysis of electromagnetic interference under different types of near-field environments

The effect of different interferences on a victim wireless device in electric and magnetic near-field (NF) environments is investigated. Using a four-port transverse electromagnetic (TEM) cell, those NF environments are generated by varying wave impedance in the cell, which can be done by applying an external interference signal. As a measure of interference, the bit error rate performance of the victim device is chosen, which shows both NF environments have significant but distinctive interference effects on the victim device.