Title :
Evaluation of gas permeation through barrier layers for organic electronic devices by helium detector method
Author :
Eun-Wook Jeong ; Dong-Yong Kim ; In-Kyun Choi ; Hong-Seok Park ; Kwun Nam Hui ; Young-Rae Cho
Author_Institution :
Dept. of Mater. Sci. & Eng., Pusan Nat. Univ., Busan, South Korea
Abstract :
Evaluation of gas permeation properties through barrier layers is important for the development of flexible organic light-emitting devices (FOLEDs). In this reported work, an helium (He) leak detector was used in a novel permeation test for metallic barrier layers. Aluminium (Al) or chromium (Cr) film was deposited as a barrier layer onto a polyethylene terephthalate (PET) substrate using a magnetron sputtering system. For the samples of PET substrates with Al and Cr films at thicknesses of 200 nm, the He pressures were 3.1 × 10-6 and 1.3 × 10-5 Torr, respectively, as measured via He detector testing. The poor permeation blocking by the Cr film was because of microcracks. The He pressure for samples with 1 000 nm thick Al coating and for Al foil (30 μm) showed different values of 3.2 × 10-8 and 1.1 × 10-10 Torr, respectively, which indicated high sensitivity in a low permeation range. The high sensitivity in permeation properties measured by He detector testing reflected the qualities of He that include one of the lightest weights known to science and a very small size. This He detector test will be useful in the development of long-life FOLEDs, as it will aid the measuring of the gas permeation properties of barrier layers that are highly effective in blocking water vapour.
Keywords :
aluminium; chromium; coatings; light emitting devices; metallic thin films; sputter deposition; Al; Cr; FOLED; PET substrates; aluminium film; blocking water vapour; chromium film; detector testing; flexible organic light-emitting devices; foil; gas permeation properties; helium leak detector method; magnetron sputtering system; metallic barrier layers; microcracks; organic electronic devices; permeation blocking; permeation testing; polyethylene terephthalate substrate; size 1000 nm; size 200 nm;
Journal_Title :
Micro & Nano Letters, IET
DOI :
10.1049/mnl.2014.0397