Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects

Author

Reed, R.A. ; Weller, Robert A. ; Akkerman, A. ; Barak, Joseph ; Culpepper, W. ; Duzellier, S. ; Foster, C. ; Gaillardin, M. ; Hubert, Guillaume ; Jordan, T. ; Jun, I. ; Koontz, S. ; Lei, Fan ; McNulty, P. ; Mendenhall, Marcus H. ; Murat, M. ; Nieminen, Pe

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA

Volume

60

Issue

3

fYear

2013

fDate

41426

Firstpage

1876

Lastpage

1911

Abstract

This anthology contains contributions from eleven different groups, each developing and/or applying Monte Carlo-based radiation transport tools to simulate a variety of effects that result from energy transferred to a semiconductor material by a single particle event. The topics span from basic mechanisms for single-particle induced failures to applied tasks like developing websites to predict on-orbit single event failure rates using Monte Carlo radiation transport tools.

Keywords

Monte Carlo methods; radiation effects; Monte Carlo-based radiation transport tools; on-orbit single event failure rates; semiconductor material; single event effects; single particle event; single-particle induced failures; Ions; Kinetic energy; Mesons; Monte Carlo methods; Neutrons; Protons; Silicon; Monte Carlo radiation transport; single event effects;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2013.2262101

Filename

6530734