Title :
Toward Scalable Indexing for Top-k Queries
Author :
Jongwuk Lee ; Hyunsouk Cho ; Sunyou Lee ; Seung-won Hwang
Author_Institution :
Dept. of Comput. Sci. & Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
Abstract :
A top-k query retrieves the best k tuples by assigning scores for each tuple in a target relation with respect to a user-specific scoring function. This paper studies the problem of constructing an indexing structure for supporting top-k queries over varying scoring functions and retrieval sizes. The existing research efforts can be categorized into three approaches: list-, layer-, and view-based approaches. In this paper, we mainly focus on the layer-based approach that pre-materializes tuples into consecutive multiple layers. We first propose a dual-resolution layer that consists of coarse-level and fine-level layers. Specifically, we build coarse-level layers using skylines, and divide each coarse-level layer into fine-level sublayers using convex skylines. To make our proposed dual-resolution layer scalable, we then address the following optimization directions: 1) index construction; 2) disk-based storage scheme; 3) the design of the virtual layer; and 4) index maintenance for tuple updates. Our evaluation results show that our proposed method is more scalable than the state-of-the-art methods.
Keywords :
database indexing; disc storage; optimisation; query processing; storage management; coarse-level layers; consecutive multiple layers; convex skylines; disk-based storage scheme; dual-resolution layer; fine-level layers; fine-level sublayers; index construction; index maintenance; layer-based approach; list-based approach; optimization directions; retrieval sizes; skylines; top-k query; user-specific scoring function; view-based approach; Indexing; Optimization; Query processing; Scalability; (exists ) -dominance; (forall ) -dominance; Knowledge management applications; Personalization; Query processing; convex skyline; dual-resolution layer; skyline;
Journal_Title :
Knowledge and Data Engineering, IEEE Transactions on
DOI :
10.1109/TKDE.2013.149