Title :
Distortion Analysis Using Volterra Series and Linearization Technique of Nano-Scale Bulk-Driven CMOS RF Amplifier
Author :
Haoran Yu ; El-Sankary, Kamal ; El-Masry, Ezz I.
Author_Institution :
Microelectron. & VLSI Res. Lab., Dalhousie Univ., Halifax, NS, Canada
Abstract :
The distortion analysis of nano-scale bulk-driven (BD) CMOS RF amplifier is presented based on Volterra series. The first three-order Volterra kernels are computed; and the closed-form expressions of the second-order and third-order harmonic distortion (HD) are derived. These expressions give good accuracy comparing with the simulation results, and can provide insight into the nonlinearity of nano-scale BD amplifier. These expressions unveil and demonstrate that the nano-scale BD MOSFET has distinct nonlinear characteristics. Also, distortion-aware design guidelines for nano-meter CMOS BD amplifier are provided. A modified second-order intermodulation (IM2) injection technique is presented to suppress the third-order intermodulation (IM3) product. This modified technique which consumes only 64 μA current employs phase adjustment of the low-frequency IM2; and up to 20 dB IM3 reduction is achieved over 1 MHz-20 MHz two-tone spacing range without gain reduction or noise penalty.
Keywords :
CMOS analogue integrated circuits; Volterra series; harmonic distortion; intermodulation distortion; linearisation techniques; radiofrequency amplifiers; Volterra series; closed-form expressions; distortion analysis; linearization technique; modified second-order intermodulation injection technique; nanoscale bulk-driven CMOS RF Amplifier; nonlinear characteristics; second-order harmonic distortion; third-order harmonic distortion; three-order Volterra kernels; CMOS integrated circuits; Harmonic distortion; Kernel; MOSFET; Radio frequency; Semiconductor device modeling; ${rm IIP}_{3}$; Amplifier; HD; IM; bulk-driven; linearization; nonlinearity; volterra series;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2014.2341116