Title :
Influence of voltage reversal on space charge behavior in oil-paper insulation
Author :
Meng Huang ; Yuanxiang Zhou ; Weijiang Chen ; Yanchao Sha ; Fubao Jin
Author_Institution :
Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
Abstract :
The presence of space charge is a serious threat to the reliability of insulation material under voltage polarity reversal. The results of space charge evolution in oil-paper insulation during external voltage polarity inverse at room temperature were presented in this paper. A mirror image effect charge was observed in the steady state, but the formation of it was affected by the first polarizing, which could cause a change of electrical property. The results showed that the mirror image effect was independent of the involved nature, type and dynamics of charge. Experiments of different reversal polarities and periods indicated that the slow decay of heterocharge retained from previous homocharge injection was the cause of electric field enhancement. And the reversal period therefore had an effect on voltage polarity reversal, namely the shorter the reverse period, the higher the stress enhancement. The reliability of oil-paper insulation could be influenced by the polarity reversal because charge injection and distribution were unpredictable, and space charge modified and in return was affected by the field as well.
Keywords :
paper; power transformer insulation; reliability; space charge; transformer oil; charge distribution; electric field enhancement; electrical property; external voltage polarity inverse; heterocharge decay; homocharge injection; insulation material reliability; mirror image effect charge; space charge behavior; stress enhancement; temperature 293 K to 298 K; transformer oil-paper insulation; Electric fields; Electrodes; Insulation; Mirrors; Reliability; Space charge; Stress; Space charge; mirror image effect; oil-paper insulation; pulse electroacoustic method; stress enhancement; voltagereversal;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2013.004010