DocumentCode
1766672
Title
Interposer Power Distribution Network (PDN) Modeling Using a Segmentation Method for 3-D ICs With TSVs
Author
Kiyeong Kim ; Jong Min Yook ; Junchul Kim ; Heegon Kim ; Junho Lee ; Kunwoo Park ; Joungho Kim
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Volume
3
Issue
11
fYear
2013
fDate
Nov. 2013
Firstpage
1891
Lastpage
1906
Abstract
In this paper, we propose models for large-sized silicon interposer power distribution networks (PDNs) and through silicon via (TSV)-based stacked grid-type PDNs using a segmentation method. We model the PDNs as distributed scalable resistance (R), inductance (L), conductance (G), and capacitance (C)-lumped models for an accurate estimation of the PDN impedance, including PDN inductance and wave phenomena such as the mode resonance at the high end of the frequency range. For this estimation, it is necessary to accurately model all transmission line (TL) sections that form the PDNs using a conformal mapping method and a phenomenological loss equivalence method (PEM). After modeling the individual TL sections, all the TL sections are connected based on a segmentation method, which is a matrix calculation method. The segmentation method accelerates the calculation speed for the PDN impedance estimation. The proposed models are successfully validated by simulations and measurements in the frequency range 0.1-20 GHz. Using the proposed models, we estimate and analyze the impedance curves of the interposer PDN and TSV-based stacked grid-type PDN with respect to the variations in the horizontal area of the interposer PDN and the number of power/ground TSVs in TSV-based stacked grid-type PDNs, respectively.
Keywords
capacitance; conformal mapping; electric impedance measurement; integrated circuit modelling; power integrated circuits; three-dimensional integrated circuits; 3D IC; PDN impedance estimation; TSV; conformal mapping method; frequency 0.1 GHz to 20 GHz; impedance curves; interposer power distribution network modeling; matrix calculation method; mode resonance; phenomenological loss equivalence method; segmentation method; stacked grid type PDN; through silicon via; wave phenomena; Capacitance; Impedance; Inductance; Mathematical model; Silicon; Solid modeling; Substrates; Conformal mapping method; interposer power distribution network (PDN); phenomenological loss equivalence method (PEM); segmentation method; through silicon via (TSV)-based stacked grid-type PDN;
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2013.2276050
Filename
6587748
Link To Document